现代电子技术2011，Vol.34Issue(18)：158-160,164,4.
基于LabVIEW的集成电路测试分析仪
IC Testing and Analysis Instrument Based on LabView
王帅1
作者信息
- 1. 湖南怀化学院物理与信息工程系,湖南怀化418008
- 折叠
摘要
Abstract
A IC testing and analysis instrument is designed and realized with LabView software and SCM technology to meet the requirements of digital IC testing in laboratories of colleges and universities. Compared with common IC testers,the system can not only complete routine function testing, but also provide arbitrary input data editing and waveform display by means of the powerful data analysis and graphical display of LabView. The extra functions can help beginners to have a accu-rate grasp and deep understanding of the logical functions of chips. SN754410 is utilized in the design process of the power-up circuit for base pin. The communication between PC and testing controller is realized through a USB/serial port conversion circuit. The experiment shows that the system has right results in function test with reliable operation. The waveform display function is intuitive and convenient. The system provides a powerful tool for chip test and digital logic verification .关键词
集成电路测试/LabVIEW/SN754410/USB/串口转换电路Key words
IC testing/ LabView/SN754410/USB/serial port conversion circuit分类
信息技术与安全科学引用本文复制引用
王帅..基于LabVIEW的集成电路测试分析仪[J].现代电子技术,2011,34(18):158-160,164,4.
