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一种微型存储测试系统的设计

单体强 陈雷 张志巍

现代电子技术2011,Vol.34Issue(20):159-161,3.
现代电子技术2011,Vol.34Issue(20):159-161,3.

一种微型存储测试系统的设计

Design of Miniature Storage Testing System

单体强 1陈雷 1张志巍1

作者信息

  • 1. 军械工程学院 弹药工程系,河北石家庄050003
  • 折叠

摘要

Abstract

While testing one weapon system, the traditional testing instrument is hard to be used due to the limit of the testing space and environment. In order to work out this problem, a miniature storage measurement system based on the MSP430 MUC was designed. Various resources are embedded in the MUC, which are utilized effectively to solve the key problem of the system miniaturization. A large capacity memorizer is adopted to achieve an abundance of data local-storage. The integrity and accuracy of the data are ensured with the optimal design of the sampling and storage strategy. The host computer processing software based on LabWindows/ CVI was developed. The experimental results show that the system is stable and reliable, able to conduct the signal sampling and storage accurately and effectively, and obtain the corresponding parameters.

关键词

存储测试/MSP430单片机/大容量存储/LabWindows/CVI

Key words

storage testing/ MSP430 MCU/ high density data storage* LabWindows/CVI

分类

信息技术与安全科学

引用本文复制引用

单体强,陈雷,张志巍..一种微型存储测试系统的设计[J].现代电子技术,2011,34(20):159-161,3.

现代电子技术

1004-373X

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