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模拟积分器性能的实验分析及泄漏电阻的测量

单希然 钟方川 罗家融 舒双宝

信息与电子工程2011,Vol.9Issue(5):635-637,659,4.
信息与电子工程2011,Vol.9Issue(5):635-637,659,4.

模拟积分器性能的实验分析及泄漏电阻的测量

Property analysis of the analog integrator and the measurement of the capacitor leakage resistance

单希然 1钟方川 1罗家融 1舒双宝1

作者信息

  • 1. 东华大学物理系,上海201620
  • 折叠

摘要

Abstract

A long time low-drift integrator is of great importance in the application in Tokamak research. Owing to the great influence of heat and humidity on the integrator operational-amplifier(op-amp) stabilities, experimental measurements of the effect of heat and humidity on the op-amp are conducted and the regularities are obtained. The results will be helpful to the design of the high performance integrator. One of the main reasons causing the drift of integrator is the leakage resistance of the integral capacitor. One method to measure the equivalent leakage resistance of capacitor is presented and an approximate relationship function between the capacitance and the voltage is given.

关键词

积分器/温度/湿度/电容漏电阻

Key words

integrator/temperature/humidity/capacitor leakage resistance

分类

信息技术与安全科学

引用本文复制引用

单希然,钟方川,罗家融,舒双宝..模拟积分器性能的实验分析及泄漏电阻的测量[J].信息与电子工程,2011,9(5):635-637,659,4.

基金项目

国家自然科学基金资助项目(10775030) (10775030)

973项目课题基金资助项目(2008CB717807) (2008CB717807)

ITER计划配套项目课题基金资助(2009GB107006) (2009GB107006)

信息与电子工程

OACSTPCD

2095-4980

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