信息与电子工程2011，Vol.9Issue(5)：600-603,4.
一种基于ARM Cortex微控制器的相位差检测方法
Phase difference measurement based on ARM cortex MCU
摘要
Abstract
This paper presents a phase difference measurement method of two sine signals based on Advanced RSIC Machines(ARM) Cortex Micro Control Unit(MCU). This measurement method firstly magnifies the phase difference, then it uses the interrupt function I/O port of ARM MCU to detect the phase difference. The hardware and software of the detecting system are designed and tested. The precision of measurement reaches 2% when the frequency of input signals is 1kHz during testing.关键词
相位差/ARM Cortex处理器/微控制器/中断Key words
phase difference/Advanced RSIC Machines/Micro Control Unit/interrupt分类
电子信息工程引用本文复制引用
刘世国,彭春荣..一种基于ARM Cortex微控制器的相位差检测方法[J].信息与电子工程,2011,9(5):600-603,4.基金项目
863计划资助项目(2008AA042207) （2008AA042207）
