| 注册
首页|期刊导航|测控技术|基于相关性模型的电路板TPS开发与验证

基于相关性模型的电路板TPS开发与验证

王成刚 王学伟 蔡士闯

测控技术2011,Vol.30Issue(10):110-113,4.
测控技术2011,Vol.30Issue(10):110-113,4.

基于相关性模型的电路板TPS开发与验证

Development and Verification of Circuit Board Test Program Set Based on Dependency Model

王成刚 1王学伟 2蔡士闯3

作者信息

  • 1. 北京理工大学光电学院,北京100081
  • 2. 海军航空工程学院基础实验部,山东烟台264001
  • 3. 海军航空工程学院控制工程系,山东烟台264001
  • 折叠

摘要

Abstract

TPS (test program set) can be used in fault detection and maintenance of circuit board. It is critical to the enhancement of maintainability of new equipment. For the developer and user of TPS, it is urgent to increase development efficiency and carry out the verification of TPS. The characteristics of different verification methods were analyzed, and a method based on dependency model was put forward, which was described in detail. Testability modeling, dependency matrix generation and diagnosis strategy design were introduced. For integrated diagnostics, this method can increase the integrated diagnostics capability, and decrease maintenance costs.

关键词

测试程序集/相关性模型/关联矩阵/诊断策略/综合诊断

Key words

TPS/ dependency model/ dependency matrix/ diagnosis strategy/ integrated diagnostics

分类

信息技术与安全科学

引用本文复制引用

王成刚,王学伟,蔡士闯..基于相关性模型的电路板TPS开发与验证[J].测控技术,2011,30(10):110-113,4.

基金项目

国家部委“十一五”预先研究项目(51319040405) (51319040405)

测控技术

OA北大核心CSCDCSTPCD

1000-8829

访问量0
|
下载量0
段落导航相关论文