高电压技术2011，Vol.37Issue(9)：2261-2265,5.
利用T型性能退化试验的金属化膜电容器可靠性评估
Reliability Assessment of Metallized Film Capacitors Using T Performance Degradation Test
摘要
Abstract
Metallized film capacitor is a kind of product with a long lifetime and high reliability,so it is difficult to assess its lifetime and reliability using the traditional statistical inference based on the large sample of data from the lifetime test.To assess the lifetime and reliability of metalized film capacitor more effectively,Firstly,we put forward a type of test called T performance degradation test,which is divided into several stages.During the test,the number of capacitors which are still working decreases stage by stage until the test lasts a long time with very fewer capacitors.Secondly,we put forward a reliability assessment method based on the data from the T performance degradation test.Finally,we give an application on the reliability assessment of the energy system of the laser facility,and obtain the lifetime of capacitor,the point estimation,and interval estimation of the capacitor reliability after 10000 and 20000 charge/discharge cycles.Research results show that a trade-off can be reached among the sample size,testing time and relevant cost by using this type of test.The lifetime and reliability of metalized film capacitor are assessed more effectively.关键词
金属化膜电容器/可靠性建模/可靠性评估/寿命预测/退化轨道/T型性能退化试验Key words
metallized film capacitor/reliability modeling/reliability assessment/life forecasting/degradation path/T performance degradation test分类
通用工业技术引用本文复制引用
孙权,汤衍真,冯静..利用T型性能退化试验的金属化膜电容器可靠性评估[J].高电压技术,2011,37(9):2261-2265,5.基金项目
国家自然科学基金 （）
