航天用SRAM型FPGA抗单粒子翻转设计OACSTPCD
SEU-tolerant design of SRAM FPGA for space use
采用SRAM工艺的FPGA因其性能优异,在空间领域的应用受到重视；但是在空间环境中,SRAM型FPGA易受单粒子翻转的影响而导致逻辑故障或功能中断.文章提出对该类芯片的配置逻辑部分采用回读比较后刷新、对其BRAM部分采用通用自纠错宏的抗单粒子翻转(SEU)设计方案,在牺牲一定的器件性能的情况下,能达到较好的抗辐射效果.
SRAM FPGA is increasingly important in space use because of its excellent performance. In the space environment, however, SRAM FPGA is vulnerable to single event upsets (SEUs), which may lead to logic faults or function interrupts. This paper proposes an SEU-tolerant design by using scrubbing after read-back comparison for the configuration logic part, and using self-correction macro for the BRAM part. This approach is shown to have satisfactory harden…查看全部>>
马寅
中国空间技术研究院载人航天总体部,北京100094
信息技术与安全科学
单粒子翻转抗辐射加固回读刷新块RAM容错
single event upsets(SEUs) radiation hardening read-back scrubbing BRAM fault tolerance
《航天器环境工程》 2011 (6)
551-556,6
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