现代电子技术2011，Vol.34Issue(22)：162-164,3.
PN结二极管散粒噪声测试方法研究
Method of Shot Noise Testing for p-n Junction Diode
郑磊1
作者信息
- 1. 中国电子科技集团公司第二十研究所,陕西西安710068
- 折叠
摘要
Abstract
Because it is hard to detect the Schottky noise in diodes, a method of low-temperature testing for Schottky noise in diodes is proposed. Before testing, UUT is putted into a low-temperature device in the shielding room to restrain the electromagnetic wave and thermal noise. The testing system is composed of the low noise amplifier, adapter and so on. Schottky noise of p-n junction diode was tested by this system. A good result was got.关键词
散粒噪声/扩散电流/低温装置/PN结Key words
p-n junction diodes shot noise/diffuse current/low-temperature device分类
信息技术与安全科学引用本文复制引用
郑磊..PN结二极管散粒噪声测试方法研究[J].现代电子技术,2011,34(22):162-164,3.
