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I-Line光刻胶材料的研究进展

郑金红

影像科学与光化学2012,Vol.30Issue(2):81-90,10.
影像科学与光化学2012,Vol.30Issue(2):81-90,10.

I-Line光刻胶材料的研究进展

Evolution and Progress of I-Line Photoresist Materials

郑金红1

作者信息

  • 1. 北京科华微电子材料有限公司,北京101312
  • 折叠

摘要

Abstract

Novolak-diazonaphthoquinone photoresists have been widely used in g-line,,I-line lithography for its high performance. Although g-line and I-line photoresists are both consisted of novolak resin and diazonaphthoquinone photoactive compounds,in order to fit I-line exposure wavelength and seeking for higher resolution,novolak resin and photoactive compounds(PAC) both have difference in structure from g-line to I-line. In I-line resist,the o-o'bonding content of resin is higher,the esterfication of PAC is higher,the proximity of DNQ groups is distant. Dissolution promoter is an important component of I-line resists,some phenolic additives were very useful to control the dissolution behavior.

关键词

i-line/光刻胶/酚醛树脂/感光剂/溶解促进剂

Key words

I-line/photoresist/novolak/photoactive compounds/dissolution promoter

分类

化学化工

引用本文复制引用

郑金红..I-Line光刻胶材料的研究进展[J].影像科学与光化学,2012,30(2):81-90,10.

影像科学与光化学

OA北大核心CSCDCSTPCD

1674-0475

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