液晶与显示2012，Vol.27Issue(1)：61-65,5.DOI:10.3788/YJYXS20122701.0061
基于MAM的白光OLED恒定应力加速寿命试验研究
Constant Stress Accelerated Life Test of White OLED Based on MAM
摘要
Abstract
In order to obtain the reliability life information of the white Organic Light-Emitting Diode (OLED) in a short time, failure data of OLED samples were collected by carrying out three groups of constant current stress accelerated life tests, and the lognormal distribution function was applied to describing the life distribution. The evolution of OLED's average life and the median life were achieved by applying the lognormal distribution to describing the life, and the self-developed life prediction software to plotting double coordinates' paper of lognormal probability, which based on map analysis method (MAM). Numerical results indicate that white OLED's life follows the lognormal distribution, that the acceleration model is consistent with inverse power law, and that the acceleration parameters which are accurately calculated make fast estimation of white OLED lifetime possible, which provides some significant guideline to its manufacturers and customers.关键词
白光OLED/加速寿命试验/对数正态分布/MAMKey words
white OLED/ accelerated life test/ lognormal distribution/ MAM分类
信息技术与安全科学引用本文复制引用
张建平,刘宇,成国梁,朱文清,刘芳..基于MAM的白光OLED恒定应力加速寿命试验研究[J].液晶与显示,2012,27(1):61-65,5.基金项目
上海市科委项目(No.11160500600,No.10dz1140206) （No.11160500600,No.10dz1140206）
新型显示技术及应用集成教育部重点实验室(上海大学)资助(No.P201002) （上海大学）
上海市自然科学基金(No.09ZR1413000,11ZR1414200) （No.09ZR1413000,11ZR1414200）
上海市教育委员会科研创新项目(No.11ZZ172,11ZZ171) （No.11ZZ172,11ZZ171）
上海市教委重点学科(第五期,No.J51304) （第五期,No.J51304）
上海市教委第三期本科教育高地建设项目 （）
