电工技术学报2012，Vol.27Issue(5)：156-163,8.
基于杂散参数辨识的IGBT模块内部缺陷诊断方法
Diagnostic Method for Internal Defects of IGBTs Base on Stray Parameter Identification
摘要
Abstract
In order to identify the early internal defects inside IGBTs and enhance the reliability level of IGBTs during running, a novel prognostic method for internal defects of IGBTs based on stray parameters identification is presented in this paper with principle and characteristic. This method employs the least square method to detect variations of stray parameters inside IGBTs as aging resulted by electrical and thermal stress, Comparing to traditional fault diagnosis, this method can provide enough time to avoid abrupt failures and damages to are verified by test results. equipment. The correctness and application value关键词
IGBT模块/可靠性/缺陷/参数辨识Key words
IGBT module/reliability/defects/parameter identification分类
信息技术与安全科学引用本文复制引用
周雒维,周生奇,孙鹏菊..基于杂散参数辨识的IGBT模块内部缺陷诊断方法[J].电工技术学报,2012,27(5):156-163,8.基金项目
国家自然科学基金（51077137）和国际科技合作计划（2010DFA72250）资助项目. （）
