桂林电子科技大学学报2012，Vol.32Issue(1)：45-48,4.
0402片式网络电阻“曼哈顿”现象的分析与改善
Analysis and improvement of Manhattan symptom on 0402 chip network resistors
赵华斌 1周德俭 2谢海军 1黄营磊1
作者信息
- 1. 桂林电子科技大学机电工程学院,广西桂林541004
- 2. 广西工学院机械工程系,广西柳州 545006
- 折叠
摘要
Abstract
In view of Manhattan symptom on 0402 chip network resistors,the cause of Manhatton phenomenon and main factors were introduced systematically. Combining with production practice, some improving and preventive actions were introduced both R&D work and manufacturing process to resolve the Manhattan phenomenon of 0402 chip network resistors. In the development stages, the footprint dimension of 0402 chip network resistors were modified; work requirements in the production processing were standarded; the failure rate of product decreased from 0.44% to 0. 04%.关键词
0402片式网络电阻/“曼哈顿”现象/表面张力/改善措施Key words
0402 chip network resistor/ Manhattan symptom/ surface tension/ improvement action分类
信息技术与安全科学引用本文复制引用
赵华斌,周德俭,谢海军,黄营磊..0402片式网络电阻“曼哈顿”现象的分析与改善[J].桂林电子科技大学学报,2012,32(1):45-48,4.
