信息与电子工程2012，Vol.10Issue(2)：217-220,4.
电荷耦合器件在电子束参数测量中的损伤问题
Damage problem of CCD in the electron beam parameters measure
摘要
Abstract
There are strong electromagnetism interruption in the process of high power electron beam parameters measure and diagnosis. The Charge Coupled Devioes(CCD) is irradiated by strong electron pulse, laser and X-ray. According to the analysis on the CCD imaging principle and the measure on high energy particles, the changes of the CCD output signals under the radiation environment are monitored as well as the CCD imaging after the experiment. The soft-damage and hard-damage of CCD are discussed. It is found that the damage occurs at the grid electrode of the device instead of at the light activated elements. The response characteristics of beam whose energy reaches the damage threshold are obtained. The evaluation on radiation damage is given, which ensures the reliability of beam parameters measure of accelerator.关键词
电子束测量/电荷耦合器件图像传感器/激光干扰/损伤阈值Key words
electron beam measure/ Charge Coupled Devices image sensors/ laser interference/ damage threshold分类
电子信息工程引用本文复制引用
王远,江孝国,李成刚,禹海军,张开志..电荷耦合器件在电子束参数测量中的损伤问题[J].信息与电子工程,2012,10(2):217-220,4.基金项目
国防科技基础研究基金资助项目(51077119) （51077119）
