宇航材料工艺2012，Vol.42Issue(2)：108-110,3.
X射线衍射全谱拟合定量分析方法研究
Quantitive Phase Analysis of Si-TiO2 by Rietveld Refinement of XRD Patterns
王晓叶 1郑斌 1冯志海1
作者信息
- 1. 航天材料及工艺研究所,先进功能复合材料技术重点实验室,北京100076
- 折叠
摘要
Abstract
X-ray diffraction method (XRD) includes two tasks: qualitative and quantitative analysis. The three ratios of (Si +TiO2) are analyzed by XRD, the quantitative analysis data were obtained from the rietveld analyses . The results show that the compositions are close to the real ratio of the samples. The Rietveld methord is reliable for the quantitative phase analysis, and the relative standard deviation was ±2% ( n = 3 ). The results demonstrate that X-ray powder diffraction combining with the rietveld refinement method is an accurate, convenient and speed-up method.关键词
X射线衍射/全谱拟合法/物相定量Key words
X-ray diffraction/ Rietiveld method/ Quantitative analysis引用本文复制引用
王晓叶,郑斌,冯志海..X射线衍射全谱拟合定量分析方法研究[J].宇航材料工艺,2012,42(2):108-110,3.
