真空电子技术Issue(2)：55-57,3.
微光像增强器管壳内部真空度恶化分析研究
Study on Decrease of Vacuum Level in Low-Light Image Intensifier
程耀进 1徐江涛 2闫磊 3侯志鹏 3师宏立 3刘峰3
作者信息
- 1. 微光夜视技术重点实验室,陕西 西安 710065
- 2. 北方夜视科技集团股份有限公司西安分公司,陕西 西安 710065
- 折叠
摘要
Abstract
Low-light image intensifier is a kind of important photoelectron devices. In order to find the reason of some image intesnfier's short working life span, this article measured vacuum change of sealed image intensifier tube and analyzed the factor which affect vacuum level based on penning discharge theory, gas diffusion theory and leakage theory. We proposed that the defect of end face sealing is the main reason cause the drop of vacuum level which has some reference value on long life image intensifier making.关键词
微光像增强器/真空度/放气/漏气Key words
Low-light image intensifier/ Vacuum level/ Outgassing/ Leakage分类
信息技术与安全科学引用本文复制引用
程耀进,徐江涛,闫磊,侯志鹏,师宏立,刘峰..微光像增强器管壳内部真空度恶化分析研究[J].真空电子技术,2012,(2):55-57,3.
