电子器件2012，Vol.35Issue(3)：249-252,4.DOI:10.3969/j.issn.1005-9490.2012.03.001
全无机胶体量子点太阳能电池中少数载流子寿命测量
Measureing Minority Carrier Lifetime in All-Inorganic Colloidal Quantum Dot Solar Cells
摘要
Abstract
The accurate measurement of the minority carrier lifetime is of vital significance in research and manufacture of solar cells. Using open circuit voltage decay ( OCVD ) technique with a nanosecond light pulse (pulse width of 8 ns, frequency of 10Hz)as excitation light source we obtained the open-circuit voltage transient response curve of all-inorganic colloidal quantum dot solar cells at different temperatures. Exact minority carrier lifetimes in cells at low (77 K -277 K)and high (277 K ~ 317 K) absolute temperature regions have been obtained as 0.369 jjls and 6. 25xl(T3 jljls.关键词
太阳电池/少数载流子寿命/开路电压衰减技术/温度Key words
solar cell/ minority carrier lifetime/ open circuit voltage decay technique/ temperature分类
信息技术与安全科学引用本文复制引用
李正阳,管秋梅..全无机胶体量子点太阳能电池中少数载流子寿命测量[J].电子器件,2012,35(3):249-252,4.基金项目
国家自然科学基金项目(10774023) （10774023）
