物理化学学报2012，Vol.28Issue(6)：1533-1538,6.DOI:10.3866/PKU.WHXB201203191
TixV1-xO2薄膜的光学及相变特性
Optical and Phase Transition Properties of TixV1-xO2 Thin Films
摘要
Abstract
TixV1-xO2 (0 ≤ x<1) thin films with different molar ratios of V/Ti were prepared on c-plane sapphire (0001) substrates by radio frequency magnetron sputtering. The microstructure and optical properties of the thin films were determined by X-ray diffraction (XRD), Raman spectroscopy, and UV-visible-near infrared (UV-Vis-NIR) spectroscopy. The width of the optical band gap was calculated and the integrated solar transmittance of the films was characterized. As the content of titanium was increased, infrared regulation and thermal hysteresis were gradually reduced until they disappeared. The results show that the band gap of the thin films broadens as the content of titanium increases, causing the optical absorption edge to exhibit a blue shift. Conversely, the band gap narrows as the proportion of vanadium is increased, which causes a red shift of the optical absorption edge.关键词
二氧化钒薄膜/二氧化钛薄膜/磁控溅射/光学性能/相变特性Key words
VO2 thin film/ TiO2 thin film/ Magnetron sputtering/ Optical property/ Phase transition property分类
化学化工引用本文复制引用
胡文亮,徐刚,马健伟,熊斌,史继富..TixV1-xO2薄膜的光学及相变特性[J].物理化学学报,2012,28(6):1533-1538,6.基金项目
国家自然科学基金(51102235),广东省产学研结合计划(2010B090400109)和广东省中国科学院全面战略合作计划(2011B090300044)资助项目 （51102235）
