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Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110

REN Qiang LIU Hui-juan ZHANG Zeng-yan FENG Jing XU Shi-chang PU Zong-jun XIN Zhi-yong

农业科学学报（英文版）2012，Vol.11Issue(4)：521-527,7.

Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110

REN Qiang ¹LIU Hui-juan ¹ZHANG Zeng-yan ¹FENG Jing ²XU Shi-chang ²PU Zong-jun ³XIN Zhi-yong¹

作者信息

1. The National Key Facility for Crop Gene Resources and Genetic Improvement/Key Laboratory of Biology and Genetic Improvement of Triticeae Crops, Ministry of Agriculture/Institute of Crop Sciences, Chinese Academy of Agricultural Sciences, Beijing 100081, P.R. China
2. Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing 100193, P.R.China
3. Crop Research Institute, Sichun Academy of Agricuttural Sciences, Chengdu 610066, P.R.China
折叠

摘要

关键词

synthetic wheat/Puccinia striiformis f. sp. tritici/resistance gene/simple sequence repeat (SSR) marker/gene postulation

Key words

synthetic wheat/Puccinia striiformis f. sp. tritici/resistance gene/simple sequence repeat (SSR) marker/gene postulation

引用本文复制引用

REN Qiang,LIU Hui-juan,ZHANG Zeng-yan,FENG Jing,XU Shi-chang,PU Zong-jun,XIN Zhi-yong..Characterization and Molecular Mapping of a Stripe Rust Resistance Gene in Synthetic Wheat CI110[J].农业科学学报（英文版）,2012,11(4):521-527,7.

基金项目

This study was funded by the 863 Program of China (2006AA100120). （2006AA100120）

农业科学学报（英文版）

OACSCD

ISSN：2095-3119

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