原子能科学技术2012，Vol.46Issue(z1)：582-586,5.
FPGA单粒子效应的脉冲激光试验方法研究
Pulsed Laser Method for SEE Testing in FPGAs
摘要
Abstract
The pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion.关键词
脉冲激光/单粒子效应/FPGA/多位翻转/翻转截面Key words
pulsed laser/ SEE/ FPGA/ MBU/ cross section分类
信息技术与安全科学引用本文复制引用
姜昱光,封国强,朱翔,上官士鹏,马英起,韩建伟..FPGA单粒子效应的脉冲激光试验方法研究[J].原子能科学技术,2012,46(z1):582-586,5.基金项目
国家自然科学基金资助项目(40974113) （40974113）
中国科学院知识创新工程青年基金项目资助(O82111A17S)及基础科研项目资助(A1320110028) （O82111A17S）
中国科学院支撑技术项目资助(110161501038) （110161501038）
