信息与电子工程2012，Vol.10Issue(6)：754-758,5.
电子器件生存概率及置信度的Bayes计算方法
Bayesian method to determine the survival probability and confidence of electrical devices under certain radiation environments
摘要
Abstract
Calculation method to determine the survival probability of electrical devices under certain radiation environments is presented. As for the commonly encountered small sampling problems in engineering practice, uniform distribution, normal distribution and normal generated distribution are assumed as the apriori survival probability of the electrical devices concerned, then the corresponding posterior distributions with respect to binnmial experiment are given. Finally, based on the experimental damaging threshold data in the form of electrical current, the point and the interval estimations of the devices' survival probability with certain degree of confidence under designated radiation environments are calculated. Results show that normal generated distribution is superior to the other two apriori distribution, which is more applicable in engineering practice.关键词
Bayes方法/小子样/生存概率/置信度/二项分布/正态分布/产生正态性能分布Key words
Bayesian method/ small sample/ survival probability/ confidence/ binomial distribution/ normal distribution / normal generated distribution分类
信息技术与安全科学引用本文复制引用
郭春营,吴成迈,段占元,林源根..电子器件生存概率及置信度的Bayes计算方法[J].信息与电子工程,2012,10(6):754-758,5.
