强激光与粒子束2013，Vol.25Issue(2)：485-489,5.DOI:10.3788/HPLPB20132502.0485
大规模集成电路抗辐射性能无损筛选方法
Non-destructive screening method for radiation hardened performance of large scale integration
周东 1郭旗 2任迪远 3李豫东 1席善斌 2孙静 1文林2
作者信息
- 1. 中国科学院新疆理化技术研究所,乌鲁木齐830011
- 2. 新疆电子信息材料与器件重点实验室,乌鲁木齐830011
- 3. 中国科学院研究生院,北京100049
- 折叠
摘要
Abstract
The space radiation environment could induce radiation damage on the electronic devices. As the performance of commercial devices is generally superior to that of radiation hardened devices, it is necessary to screen out the devices with good radiation hardened performance from the commercial devices and applying these devices to space systems could improve the reliability of the systems. Combining the mathematical regression analysis with the different physical stressing experiments, we investigated the non-destructive screening method for radiation hardened performance of the integrated circuit. The relationship between the change of typical parameters and the radiation performance of the circuit was discussed. The irradiation-sensitive parameters were confirmed. The pluralistic linear regression equation toward the prediction of the radiation performance was established. Finally, the regression equations under stress conditions were verified by practical irradiation. The results show that the reliability and accuracy of the non-destructive screening method can be elevated by combining the mathematical regression analysis with the practical stressing experiment.关键词
大规模集成电路/无损筛选/辐射损伤/回归分析/物理应力Key words
large scale integrations non-destructive screening/ radiation damage/ regression analysis/ physical stress分类
信息技术与安全科学引用本文复制引用
周东,郭旗,任迪远,李豫东,席善斌,孙静,文林..大规模集成电路抗辐射性能无损筛选方法[J].强激光与粒子束,2013,25(2):485-489,5.
