| 注册
首页|期刊导航|现代电子技术|纳米级ta-C薄膜对二次电子发射抑制的研究

纳米级ta-C薄膜对二次电子发射抑制的研究

张娜 陈仙 康永锋

现代电子技术2013,Vol.36Issue(1):144-146,3.
现代电子技术2013,Vol.36Issue(1):144-146,3.

纳米级ta-C薄膜对二次电子发射抑制的研究

Research on secondary electron emission suppression using nanoscale ta-C film

张娜 1陈仙 2康永锋1

作者信息

  • 1. 空间微波技术重点实验室,陕西西安710100
  • 2. 西安交通大学,陕西西安710049
  • 折叠

摘要

Abstract

The multipactor discharge restricts the development of space communication technique seriously. In this paper, a method for suppressing the secondary electron emission using the ta-C film with nanometers thickness was presented. The technolo-gy of deposing the ta-C film on the aluminum electrode with the silver film was studied. As well as, the sp2 content of the film and the thickness of the film affecting the secondary electron emission coefficient were investigated in detail. The results showed that the secondary electron emission coefficient for treated electrode was decreased obviously, and the maximum value of the secondary elec-tron emission coefficient was reduced by 35 percent compared with untreated one. Moreover, when the thickness of the film was more than 5 nm, the secondary electron emission coefficient was decreased obviously; when thickness of the film was more than 10 nm, the secondary electron emission coefficient was increased on the contrary. The experimental results indicated that the film was mainly graphite morphology types with low secondary electron emission property because of high sp2 content when the thick-ness of the film was between 5 nm and 10 nm. In results, the ta-C film can suppress the secondary electron emission very well.

关键词

ta-C薄膜/二次电子倍增放电/抑制二次电子发射/过滤阴极真空电弧

Key words

ta-C film/multipactor discharge/secondary electron emission suppression/filtered cathodic vacuum arc

分类

信息技术与安全科学

引用本文复制引用

张娜,陈仙,康永锋..纳米级ta-C薄膜对二次电子发射抑制的研究[J].现代电子技术,2013,36(1):144-146,3.

基金项目

空间微波技术重点实验室资助项目(914C5304011003) (914C5304011003)

现代电子技术

OACSTPCD

1004-373X

访问量4
|
下载量0
段落导航相关论文