原子能科学技术2012，Vol.46Issue(11)：1388-1392,5.
大规模集成电路抗辐射性能无损筛选方法研究
Research on Non-destructive Screening Method for Radiation Hardened Performance of Very Large Scale Integrated Circuit
周东 1郭旗 2李豫东 3李明 1席善斌 2许发月 1王飞2
作者信息
- 1. 中国科学院新疆理化技术研究所,新疆乌鲁木齐830011
- 2. 新疆电子信息材料与器件重点实验室,新疆乌鲁木齐830011
- 3. 中国科学院研究生院,北京100049
- 折叠
摘要
Abstract
Combining the mathematical regression analysis with the physical stressing experiment, the non-destructive screening method for radiation hardened performance of integrated circuit was investigated. The relationship between the change of typical parameters and the radiation performance of the circuit was discussed. The sensitive parameters to irradiation were confirmed. The pluralistic linear regression equation for the prediction of the radiation performance was established. Finally, the regression equations under stress conditions were verified by practical irradiation. The results show that the reliability of the non-destructive screening method can be improved by combining the mathematical regression analysis with the practical stressing experiment.关键词
无损筛选/辐射损伤/回归分析/物理应力Key words
non-destructive screening/ radiation damage/ regression analysis/ physical stress分类
信息技术与安全科学引用本文复制引用
周东,郭旗,李豫东,李明,席善斌,许发月,王飞..大规模集成电路抗辐射性能无损筛选方法研究[J].原子能科学技术,2012,46(11):1388-1392,5.
