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A low leakage power-rail ESD detection circuit with a modified RC network for a 90-nm CMOS process

Yang Zhaonian Liu Hongxia Wang Shulong

半导体学报（英文版）2013，Vol.34Issue(4)：116-120,5.

半导体学报（英文版）2013，Vol.34Issue(4)：116-120,5.DOI:10.1088/1674-4926/34/4/045010

A low leakage power-rail ESD detection circuit with a modified RC network for a 90-nm CMOS process

Yang Zhaonian ¹Liu Hongxia ¹Wang Shulong¹

作者信息

1. Key Laboratory of Wide Bandgap Semiconductor Materials and Devices of Ministry of Education, School of Microelectronics,Xidian University, Xi'an 710071, China
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摘要

关键词

clamp circuit/ electrostatic discharge/ leakage current/ RC network

Key words

clamp circuit/ electrostatic discharge/ leakage current/ RC network

引用本文复制引用

Yang Zhaonian,Liu Hongxia,Wang Shulong..A low leakage power-rail ESD detection circuit with a modified RC network for a 90-nm CMOS process[J].半导体学报（英文版）,2013,34(4):116-120,5.

基金项目

Project supported by the National Natural Science Foundation of China (Nos.61076097,60936005) and the Cultivation Fund of the Key Scientific and Technical Innovation Project,Ministry of Education of China Program (No.20110203110012). （Nos.61076097,60936005）

半导体学报（英文版）

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ISSN：1674-4926

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