电测与仪表2012，Vol.49Issue(z1)：10-13,4.
用光电隔离法提高小电容测量灵敏度问题的研究
Improve Small Capacitance Measurement Sensitivity by Opto-electronic Isolation Method
王维 1何小兵 1戴冬雪 1黄璐 1杨雁1
作者信息
- 1. 中国计量科学研究院电学与磁学所,北京100013
- 折叠
摘要
Abstract
The cross capacitor of NIM established in 1970s is the primary standard of Chinese capacitance traceability system.It has a relative uncertainty of 1 in 107.The value of the capacitor is about 0.5 pF.This small value leads to a low SNR,and the sensitivity of the measurement is about several parts in 108.An opto-electronic isolating method is designed in this paper,cooperated with a lock-in amplifier,which can improve the capacitance measurement sensitivity to 1 in 108.关键词
计算电容/信噪比/灵敏度Key words
cross capacitor/SNR/sensitivity分类
信息技术与安全科学引用本文复制引用
王维,何小兵,戴冬雪,黄璐,杨雁..用光电隔离法提高小电容测量灵敏度问题的研究[J].电测与仪表,2012,49(z1):10-13,4.
