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Error analysis and correction of high-accuracy modulation domain measurement

DU Nian-wen ZHU Wei MAO Li-ming

测试科学与仪器2013，Vol.4Issue(2)：142-145,4.

测试科学与仪器2013，Vol.4Issue(2)：142-145,4.DOI:10.3969/j.issn.1674-8042.2013.02.010

DU Nian-wen ¹ZHU Wei ²MAO Li-ming¹

作者信息

1. Science and Technology on Electronic Test & Measurement Laboratory, Qingdao 266555, China
2. The 41st Institute of China Electronics Technology Group Corporation , Qingdao 266555, China
折叠

modulation domain/time-to-digital converter (TDC)/error analysis

modulation domain/time-to-digital converter (TDC)/error analysis

信息技术与安全科学

DU Nian-wen,ZHU Wei,MAO Li-ming..Error analysis and correction of high-accuracy modulation domain measurement[J].测试科学与仪器,2013,4(2):142-145,4.

ISSN：1674-8042

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