计算机与现代化Issue(8)：99-101,3.DOI:10.3969/j.issn.1006-2475.2013.08.025
基于MARCH算法的SRAM内建自测试设计
Design of BIST Testing SRAM Based on MARCH Algorithm
张铜 1成本茂 1张小锋1
作者信息
- 1. 南昌航空大学信息与工程学院,江西南昌330063
- 折叠
摘要
Abstract
With the development of complexity and integration of FPGA,the test technology becomes more important.But the test costs the highest in the design and is the most difficult.As the rapid development of the System-on-Chip,the rate of ATE and memory space of ATE can not satisfy the requirements of the test,so the Built-In-Self-Test method appeared in this world.The purpose of design is to achieve a BIST machine to test a SRAM of 32 words each of 8-bits.The algorithm to be used for BIST is MARCH algorithm.The design should be implemented in Verilog,simulated using Qautus lⅡ 9.0.关键词
内建自测试/MARCH算法/QautusⅡ9.0Key words
Built-In-Self-Test(BIST) / MARCH algorithm/ Qautus Ⅱ9.0分类
信息技术与安全科学引用本文复制引用
张铜,成本茂,张小锋..基于MARCH算法的SRAM内建自测试设计[J].计算机与现代化,2013,(8):99-101,3.
