物理化学学报2013，Vol.29Issue(7)：1370-1384,15.DOI:10.3866/PKU.WHXB201304191
原子分辨显微分析技术研究进展
Research Progress in Atomic Resolution Microscopy
摘要
Abstract
Tremendous progress has been made in non-contact atomic force microscopy (NC-AFM) recently.The spatial resolution of NC-AFM imaging and spectroscopy of individual molecules on surfaces has reached true atomic resolution and bond differentiation level.Combination of NC-AFM with other scanning probe techniques can open a new way for materials,physics,chemistry,and biochemistry studies.In this review,we first introduce the basic principle of NC-AFM and qPlus sensor.The interaction force at atomic scale and precise measurement of short-range force are discussed.We summarize the recent advances in structural determination of organic molecules,chemical identification,electronic structure,and atomic manipulation at the atomic scale.In addition,we also discuss the application of Kelvin probe force microscopy (KPFM) in measurement of local contact potential difference (LCPD).Finally,perspectives and challenges in NC-AFM techniques are presented.关键词
扫描探针显微技术/非接触原子力显微技术/qPlus传感器/化学识别/原子操纵/电子结构/开尔文探针力显微技术Key words
Scanning probe microscopy/ Non-contact atomic force microscopy/ qPlus sensor/Chemical identification/ Atomic manipulation/ Electronic structure/ Kelvin probe force microscopy分类
化学化工引用本文复制引用
袁秉凯,陈鹏程,仉君,程志海,裘晓辉,王琛..原子分辨显微分析技术研究进展[J].物理化学学报,2013,29(7):1370-1384,15.基金项目
The project was supported by the National Key Basic Research Program of China (2012CB933001) and National Natural Science Foundation of China (21173058).国家重大科学研究计划(2012CB933001)和国家自然科学基金(21173058)资助 （2012CB933001）
