半导体学报（英文版）2013，Vol.34Issue(12)：53-59,7.DOI:10.1088/1674-4926/34/12/124006
Total ionizing dose effects on 12-bit CBCMOS digital-to-analog converters
Total ionizing dose effects on 12-bit CBCMOS digital-to-analog converters
Wang Xin 1Lu Wu 2Guo Qi 3Wu Xue 1Xi Shanbin 2Deng Wei 1Cui Jiangwei2
作者信息
- 1. Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China
- 2. Xinjiang Key Laboratory of Electronic Information Materials and Devices, Urumqi 830011, China
- 3. University of Chinese Academy of Sciences, Beijing 100049, China
- 折叠
摘要
关键词
digital-to-analog/ CBCMOS/ dose rate effect/ ionizing radiationKey words
digital-to-analog/ CBCMOS/ dose rate effect/ ionizing radiation引用本文复制引用
Wang Xin,Lu Wu,Guo Qi,Wu Xue,Xi Shanbin,Deng Wei,Cui Jiangwei..Total ionizing dose effects on 12-bit CBCMOS digital-to-analog converters[J].半导体学报（英文版）,2013,34(12):53-59,7.
