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电磁型欠压脱扣器可靠性与关键电路设计

吴志祥 方晓毅 黄波 刘丽娟

电子器件Issue(1):134-137,4.
电子器件Issue(1):134-137,4.DOI:10.3969/j.issn.1005-9490.2014.01.032

电磁型欠压脱扣器可靠性与关键电路设计

Research and Design of Under-Voltage Releaser

吴志祥 1方晓毅 1黄波 2刘丽娟2

作者信息

  • 1. 常州工学院,江苏 常州213002
  • 2. 江苏国星电器有限公司,江苏 常州213177
  • 折叠

摘要

Abstract

In order to improve the reliability of electromagnetic type undervoltage release,based on the deficiency analysis of the existing scheme,a new scheme of a reliable electromagnetic undervoltage releaser is proposed by op-timizing structure of main circuit. With the new scheme,the specific analysis and design of main circuit,single-chip microcomputer circuit and power circuit are demonstrated. Experiments show that the new scheme has the advantages that the overall power consumption of the new scheme circuit itself is only milliwatts and the accuracy of action point is limited within plus or minus 2 V while the cost is quite low. The scheme has successfully passed the 1. 3 times rated voltage aging test and the 4 kV EFT test.

关键词

低压断路器/欠压脱扣器/可靠性/电路设计/瞬时脱扣/延时脱扣

Key words

low voltage circuit breaker/under-voltage releaser/reliability/circuit design/instantaneous trip/delay trip

分类

信息技术与安全科学

引用本文复制引用

吴志祥,方晓毅,黄波,刘丽娟..电磁型欠压脱扣器可靠性与关键电路设计[J].电子器件,2014,(1):134-137,4.

基金项目

常州市知识产权计划项目(CK20122008) (CK20122008)

电子器件

OA北大核心CSTPCD

1005-9490

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