地质调查与研究Issue(1)：77-80,4.
X射线粉晶衍射仪测定萤石晶胞参数
Detecting of Fluorite Crystal Cell Parameters by X-ray Powder Diffraction
摘要
Abstract
The pure fluorites were full spectrum scanned by the X-ray powder diffractometer. On the basis of top 5 strong diffraction peaks of the fluorites, the values of the peaks can be accurately marked. The values of the an-gle 2θwere arranged in descending longitudinal, which could calculate the 1/d2 values of different d values. The value of the minimum line of the 1/d2 value divided by the 1/d2 values of the remaining lines, with the result val-ue D still lining;According to the decimal part of D value is 0.36 or 0.68, it’s deduced that the first line of the flu-orite low angle is surface{111}diffraction, and its corresponding h2+k2+l2 value is 3. The value 3 of the first line h2+k2+l2 multiplied by D values of the remaining lines respectively. The results of h2+k2+l2 values were still lined, such as 8.04, 11.04, 16.08 and 19.08. Due to the error of measuring, abandoning the data after the deci-mal point, keeping integer bits, it can be obtained the corresponding h2+k2+l2 values, as 3、8、11、16 and 19. According to h2+k2+l2 values, it could be obtained the corresponding net surface index, as{111},{220},{311},{400}and{331}. According to the crystal cell parameters formula:a=d (hkl) (h2+k2+l2) 1/2, it could be calculat-ed the value of crystal cell parameters, 0.546 nm.关键词
X射线衍射/萤石衍射图谱/指标化/晶胞参数Key words
X-ray diffraction/fluorite diffraction pattern/index/cell parameters分类
地质学引用本文复制引用
迟广成,肖刚,伍月..X射线粉晶衍射仪测定萤石晶胞参数[J].地质调查与研究,2014,(1):77-80,4.基金项目
国土资源部“变质岩岩石矿物鉴定检测技术方法研究”项目 （）
