物联网技术Issue(12)：31-33,3.
某型导弹发射装置随动测试故障分析解决方案
Failure analysis and solutions of follow-up test for one guided missile launcher
王冰 1王孝勃2
作者信息
- 1. 海军装备部，陕西 西安 710077
- 2. 中航工业集团公司，陕西 西安 710077
- 折叠
摘要
Abstract
The error of follow-up test caused by the abnormal 1553B bus communication in one guided missile launcher is analyzed. The reason for the error is found out, and at the same time the correct solution for the error the veriifcation results of the effectiveness are given.关键词
MIL-STD-1553B总线/BU-61580总线接口芯片/RT终端/闩锁效应/总线耦合器Key words
MIL-STD-1553B bus/BU-61580 bus interface chip/RT terminal/latch-up effect/BUS coupler分类
信息技术与安全科学引用本文复制引用
王冰,王孝勃..某型导弹发射装置随动测试故障分析解决方案[J].物联网技术,2013,(12):31-33,3.
