物理学报Issue(19)：402-407,6.DOI:10.7498/aps.62.197201
Au/SrTiO3/Au界面电阻翻转效应的低频噪声分析
Low frequency noise analysis and resistance relaxation in Au/SrTiO3/Au for bipolar resistive switching
摘要
Abstract
The resistance relaxation in Au/SrTiO3/Au sandwiches with bipolar resistance switching has been investigated by the low fre-quency analysis. The power spectral density of the conducting current fluctuation in the high resistance state and the low resistance state shows 1/f behaviors. By contrast experiment, the low frequency noise for the high resistance state is ascribed to the Schottky barrier under reverse bias and the oxygen vacancy diffusion, while the noise in the low resistance state is due to the carriers fluctuation arising from the oxygen vacancy migration. The resistance relaxation can be further understood as the diffusion of oxygen vacancies under an electric field.关键词
电阻翻转效应/低频噪声/氧空位Key words
resistive switching/low frequency noise/oxygen vacancies引用本文复制引用
王爱迪,刘紫玉,张培健,孟洋,李栋,赵宏武..Au/SrTiO3/Au界面电阻翻转效应的低频噪声分析[J].物理学报,2013,(19):402-407,6.基金项目
国家重点基础研究发展规划项目(批准号:2009CB930803,2013CB921700)和国家自然科学基金(批准号:10834012)资助的课题 （批准号:2009CB930803,2013CB921700）
