物理学报Issue(8)：086101-1-086101-7,7.DOI:10.7498/aps.63.086101
静态随机存储器总剂量辐射损伤的在线与离线测试方法
Online and offine test method of total dose radiation damage on static random access memory
丛忠超 1周航 2余学峰 1崔江维 2郑齐文 1郭旗 1孙静 1汪波 2马武英 1玛丽娅1
作者信息
- 1. 新疆理化技术研究所，中国科学院特殊环境功能材料与器件重点实验室，新疆电子信息材料与器件重点实验室，乌鲁木齐 830011
- 2. 中国科学院大学，北京 100049
- 折叠
摘要
Abstract
In this paper, for the study of static random access memory (SRAM), the online-test and offine-test are carried out on the total dose radiation damages. The differences between the two kinds of test methods and physical mechanisms are investigated. The results show that SRAM present multiple failure mode, the online-test only includes one fixed failure mode and the offine-test includes multiple failure mode. Due to the restrictions on signal integrity at test frequency, the online dynamic current test value is significantly less than offine test value. Since the existence of imprinting effect, the online-test static current is significantly less than offine-test value when the device-stored data are opposite to irradiation data. The parameters that cannot be detected online, may lapse prior to the data that could be detected online. The results are significantly important for studying the total dose radiation effect and the experimental evaluation of SRAM under radiation environment.关键词
在线测试/离线测试/静态随机存储器/功能测试Key words
online-test/offine-test/static random access memory/functional test引用本文复制引用
丛忠超,周航,余学峰,崔江维,郑齐文,郭旗,孙静,汪波,马武英,玛丽娅..静态随机存储器总剂量辐射损伤的在线与离线测试方法[J].物理学报,2014,(8):086101-1-086101-7,7.
