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Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

Li YANG Yu-song TU Hui-li TAN

应用数学和力学2014，Vol.35Issue(5)：567-574,8.

应用数学和力学2014，Vol.35Issue(5)：567-574,8.DOI:10.1007/s10483-014-1813-7

Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

Li YANG ¹Yu-song TU ²Hui-li TAN¹

作者信息

1. College of Physics Science and Technology, Guangxi Normal University,Guilin 541004, Guangxi Province, P.R.China
2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P.R.China
折叠

摘要

关键词

capillary force/ van der Waals force/ adhesion force/ curvatures probe shape

Key words

capillary force/ van der Waals force/ adhesion force/ curvatures probe shape

分类

数理科学

引用本文复制引用

Li YANG,Yu-song TU,Hui-li TAN..Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment[J].应用数学和力学,2014,35(5):567-574,8.

基金项目

Project supported by the National Natural Science Foundation of China (Nos.11105088 and 81060307),the Innovation Program of Shanghai Municipal Education Commission (No.11YZ20),the Guangxi Natural Science Foundation Program (No.2013GXNSFBA019006),and the Guangxi Province Higher Educational Science and Technology Program (No.2013YB033) （Nos.11105088 and 81060307）

应用数学和力学

OA北大核心CSCDCSTPCD

ISSN：1000-0887

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