半导体学报（英文版）2014，Vol.35Issue(5)：64-68,5.DOI:10.1088/1674-4926/35/5/054010
Long-term storage life of light source modules by temperature cycling accelerated life test
Long-term storage life of light source modules by temperature cycling accelerated life test
Sun Ningning 1Tan Manqing 1Li Ping 2Jiao Jian 3Guo Xiaofeng 1Guo Wentao1
作者信息
- 1. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
- 2. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
- 3. Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
- 折叠
摘要
关键词
light source modules/ temperature cycling/ storage life/ activation energy/ reliabilityKey words
light source modules/ temperature cycling/ storage life/ activation energy/ reliability引用本文复制引用
Sun Ningning,Tan Manqing,Li Ping,Jiao Jian,Guo Xiaofeng,Guo Wentao..Long-term storage life of light source modules by temperature cycling accelerated life test[J].半导体学报（英文版）,2014,35(5):64-68,5.
