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Influence of finite size probes on the measurement of electrical resistivity using the four-probe technique

He Kai Li Yang Chen Xing Wang Jianxin Zhang Qinyao

半导体学报（英文版）2014，Vol.35Issue(8)：20-23,4.

半导体学报（英文版）2014，Vol.35Issue(8)：20-23,4.DOI:10.1088/1674-4926/35/8/082003

Influence of finite size probes on the measurement of electrical resistivity using the four-probe technique

He Kai ¹Li Yang ²Chen Xing ¹Wang Jianxin ²Zhang Qinyao¹

作者信息

1. Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
2. University of Chinese Academy of Sciences, Beijing 100049, China
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摘要

关键词

electrical resistance/ four-probe technique/ finite size probes/ image method

Key words

electrical resistance/ four-probe technique/ finite size probes/ image method

引用本文复制引用

He Kai,Li Yang,Chen Xing,Wang Jianxin,Zhang Qinyao..Influence of finite size probes on the measurement of electrical resistivity using the four-probe technique[J].半导体学报（英文版）,2014,35(8):20-23,4.

基金项目

Project supported by the Innovation Project of the Shanghai Institute of Technical Physics,CAS (No.CXJJ-Q-DX-57). （No.CXJJ-Q-DX-57）

半导体学报（英文版）

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ISSN：1674-4926

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