首页|期刊导航|半导体学报（英文版）|Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Guo Chunsheng Zhang Yanfeng Wan Ning Zhu Hui Feng Shiwei

半导体学报（英文版）2014，Vol.35Issue(8)：110-114,5.

半导体学报（英文版）2014，Vol.35Issue(8)：110-114,5.DOI:10.1088/1674-4926/35/8/084010

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Guo Chunsheng ¹Zhang Yanfeng ¹Wan Ning ¹Zhu Hui ¹Feng Shiwei¹

作者信息

1. College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
折叠

摘要

关键词

Arrhenius model/ accelerated life tests/ failure mechanisms/ lognormal distribution

Key words

Arrhenius model/ accelerated life tests/ failure mechanisms/ lognormal distribution

引用本文复制引用

Guo Chunsheng,Zhang Yanfeng,Wan Ning,Zhu Hui,Feng Shiwei..Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions[J].半导体学报（英文版）,2014,35(8):110-114,5.

基金项目

Project supported by the National Natural Science Foundation of China (No.61204081),the Research Project in Guangdong Province,China (No.2011 B090400463),and the Guangdong Provincial Science and Technology Major Project of the Ministry of Science and Technology of China (Nos.2011A080801005,2012A080304003). （No.61204081）

半导体学报（英文版）

OACSCDCSTPCDEI

ISSN：1674-4926

访问量0

下载量0

段落导航