理化检验-物理分册2014，Vol.50Issue(9)：658-667,691,11.
衍射线宽化的线形分析和微结构表征
Line Profile Analysis of Diffraction Line Broaden and Characterization of Microstructure
摘要
关键词
线形分析/微晶尺度/微观应力/层错/位错/XRD/最小二乘方法Key words
analysis of line profile/ crystallite size/ microcosmic stress/ stacking faults/ dislocation/ XRD/the least square method分类
矿业与冶金引用本文复制引用
杨传铮,姜传海..衍射线宽化的线形分析和微结构表征[J].理化检验-物理分册,2014,50(9):658-667,691,11.
