表面技术Issue(2)：115-118,4.DOI:10.16490/j.cnki.issn.1001-3660.2015.02.022
新型AFM原子分辨率导电探针技术研究
Development of a Novel Conductive Probe at Atomic Resolution in UHV-AFM
摘要
Abstract
ABSTRACT:Objective To prepare a novel conductive probe to solve the existing problems such as the relatively large curvature radius of the tip of the conductive cantilever, high saturated magnetic force, low resolution and bad modulation. Methods A con-ductive film Si probe was obtained by evaporating of the Si probe tip with conductive metal thin film, the thickness of the Fe film was only a few nanometers, and meanwhile the curvature radius was ensured to be around 10 nm. The probe NaCl(001) surface before and after coating was observed and scanned by TEM and UHV-AFM, respectively, and the properties were analyzed. Re-sults Because of the metal thin film evaporation, the home-built Fe thin film Si probe had a stable probe tip performance, and the hanging key effect of Si probe scanning was eliminated. At the same time, the scanning resolution of the system was elevated. Conclusion Conductive film Si probe made full use of existing equipments for experiments. It has advantages such as low cost, easy to use and stable performance. It can be used as an important tool for the magnetic exchange force measurements in spin research at atomic resolution in the future.关键词
导电薄膜/Si探针/原子分辨率/磁交换力显微镜Key words
conductive film/si probe/atomic resolution/MExFM分类
矿业与冶金引用本文复制引用
张欢,马宗敏,谢艳娜,唐军,石云波,薛晨阳,刘俊,李艳君..新型AFM原子分辨率导电探针技术研究[J].表面技术,2015,(2):115-118,4.基金项目
国家自然科学基金重点支持项目(91336110) （91336110）
国家自然科学基金杰出青年基金(51225504) （51225504）
国家自然科学基金(61274103) Fund：Supported by the Major Program of the National Natural Science Foundation of China (91336110),the National Natural Science Foundation for Distin-guished Young Scholars of China (51225504) （61274103）
and the National Natural Science Foundation of China (61274103) （61274103）
