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Co-Pi和Cu2O共修饰TiO2薄膜及其光电化学性质研究

姜春香 沈明荣

Journal of Changshu Institute of TechnologyIssue(4):51-54,4.
Journal of Changshu Institute of TechnologyIssue(4):51-54,4.

Co-Pi和Cu2O共修饰TiO2薄膜及其光电化学性质研究

Fabrication and Photoelectrochemical Properties of Co-Pi and Cu2O Co-decorated TiO2 films

姜春香 1沈明荣1

作者信息

  • 1. 苏州大学 物理科学与技术学院,江苏 苏州 215006
  • 折叠

摘要

Abstract

TiO2 film is prepared on Ti substrates by anodic oxidation method. Then Co-Pi and Cu2O particles are fabricated on TiO2 flat surface using a facial electrochemical deposition method. Scanning electron microsco-py, X-ray diffraction and photoelectrochemical properties reflect that depositing Co-Pi particles in advance on the surface of TiO2 thin films can prevent Cu2O forming stacked particle structure, increase the photocurrent sig-nificantly, and deposit Co-Pi after Cu2O makes Cu2O reduction to Cu and that at the same time the morphology changes a lot. Specifically, when the deposition time of Co-Pi is set to be 300 s, the structure of TiO2/Co-Pi/Cu2O can get the maximum photocurrent of 200 A cm-2 .

关键词

TiO2薄膜/Co-Pi/Cu2O/电化学沉积/光电化学性质

Key words

Titatium oxide film/Co-Pi/Cuprous oxide/electrochemical deposition method/photoelectrochemi-cal properties

分类

化学化工

引用本文复制引用

姜春香,沈明荣..Co-Pi和Cu2O共修饰TiO2薄膜及其光电化学性质研究[J].Journal of Changshu Institute of Technology,2014,(4):51-54,4.

基金项目

高等学校博士学科点专项科研基金(博导类)资助项目“Cu2O过渡层提高PZT铁电梯度薄膜光电转换效率的研究” ()

Journal of Changshu Institute of Technology

1008-2794

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