电源技术Issue(4)：810-814,5.
电子器件关键寿命参数获取及性能退化研究
Study on key life parameters acquisition and performance degradation of electronic devices
摘要
Abstract
The relationship of the potential defect and life with life characteristic and information were studied, and the life prediction depending on life initial information was introduced. The performance degradation rules of the relays were studied based on the sequence information matrix that contains many parameters and sampling points. The mass of data related had to be compressed. Some methods combined with neural network were used to select the sample of sequence information, and the choosing method of samples was determined by comparing the errors. To extract the key performance parameters, the column vectors of sequence information matrix were processed with principal component analysis. The proper value function was constructed to acquire the characteristic quantity which can describe the comprehensive performance reliability of the relays. The performance degradation model of the relays was studied.关键词
电子器件/退化/神经网络/主成分分析Key words
electronic device/degradation/neural network/principal component analysis分类
信息技术与安全科学引用本文复制引用
王嘉,李志刚,王博然..电子器件关键寿命参数获取及性能退化研究[J].电源技术,2015,(4):810-814,5.基金项目
国家自然科学基金 （）
