单片机与嵌入式系统应用Issue(6)：19-21,25,4.
单片机的电磁抗扰度仿真与实验研究∗
MicrocontroIIer EIectromagnetic Immunity SimuIation and ExperimentaI Study
摘要
Abstract
In order to solve the problem of the microcontroller electromagnetic compatibility,the paper researches the electromagnetic im-munity using a combination of experimental and simulation methods.Firstly,the microprocessor electromagnetic immunity is tested with DPI.Secondly,an electromagnetic immunity ICEM model is proposed based DPI.IC-EMC simulation software is used to simulate a mi-croprocessor core voltage at different frequencies.The results show that the simulation data agrees with the experimental data in low-band,so using the model can predict the electromagnetic immunity.关键词
电磁兼容/DPI/电磁抗扰度Key words
electromagnetic compatibility/DPI/electromagnetic immunity分类
信息技术与安全科学引用本文复制引用
孙朕,郝长峰..单片机的电磁抗扰度仿真与实验研究∗[J].单片机与嵌入式系统应用,2015,(6):19-21,25,4.基金项目
国家国际科技合作专项项目(2012DFR80740) （2012DFR80740）
交通运输部西部交通建设科技项目(2011318221360) （2011318221360）
