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一种多通道NAND Flash阵列的坏块管理方案

张雯 崔建杰 张新

电子器件Issue(5):816-821,6.
电子器件Issue(5):816-821,6.DOI:10.3969/j.issn.1005-9490.2014.05.004

一种多通道NAND Flash阵列的坏块管理方案

Bad Block Management Method of Multi-Channel NAND Flash Array

张雯 1崔建杰 2张新3

作者信息

  • 1. 西安邮电大学电子工程学院,西安710121
  • 2. 西安奇维科技股份有限公司研发中心,西安710077
  • 3. 西安奇维科技股份有限公司研发中心,西安710077
  • 折叠

摘要

Abstract

Aiming at the requirement about the reliability of the multi-channel NAND Flash array,a bad block man-agement method is proposed. The method optimizes the bad block information storage and query methods. A FRAM stores the LBA-PBA address mapping table. The data of tests shows that the method can achieve multi-channel NAND Flash array of bad block management to ensure the reliability of storage. Optimized bad block creation method reduces the bad block query time. The FRAM saves the time of the valid block address mapping. And with the ferroelectric the reliability of data storage is further improved.

关键词

大容量存储/坏块管理/二分法/NAND Flash阵列/FRAM

Key words

large capacity storage/bad block management/dichotomy/NAND Flash array/FRAM

分类

信息技术与安全科学

引用本文复制引用

张雯,崔建杰,张新..一种多通道NAND Flash阵列的坏块管理方案[J].电子器件,2014,(5):816-821,6.

基金项目

西安市科技计划基金项目(CXY1117[5]) (CXY1117[5])

电子器件

OA北大核心CSTPCD

1005-9490

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