电子器件Issue(1)：44-48,5.DOI:10.3969/j.issn.1005-9490.2015.01.010
半导体封装测试生产线瓶颈检测的一种方法∗
A Method of Bottleneck Detection of Semiconductor Assembly and Test Production Line
摘要
Abstract
Bottleneck exists in all semiconductor production system. In order to improve the production capacity of the entire production system,we only improve the production capacity of the bottleneck. In the past,the method of bottleneck detection is too single,to apply difficultly to more complex semiconductor production system. The produc-tion model of semiconductor assembly and test production system is set up based on the previous researches. It over-comes the disadvantages of the previous method and comes to a method of bottleneck detection of semiconductor as-sembly and test production line. It demonstrates the effectiveness and robustness of the method by some examples.关键词
半导体封装测试/生产瓶颈/瓶颈检测/识别指标Key words
semiconductor assembly and testing/bottlenecks in production/bottleneck detection/identify indicators分类
信息技术与安全科学引用本文复制引用
张国辉,刘昶,姚丽丽,史海波..半导体封装测试生产线瓶颈检测的一种方法∗[J].电子器件,2015,(1):44-48,5.基金项目
国家重大科技专项项目(2011ZX02601-005) （2011ZX02601-005）
