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简易数字控制晶体管测试仪的设计∗

荣军 何飞 张国云 丁跃浇

电子器件Issue(2):377-381,5.
电子器件Issue(2):377-381,5.DOI:10.3969/j.issn.1005-9490.2015.02.030

简易数字控制晶体管测试仪的设计∗

The Design of Simple and Digital Control Transistor Tester

荣军 1何飞 2张国云 1丁跃浇2

作者信息

  • 1. 湖南理工学院信息与通信工程学院,湖南 岳阳414006
  • 2. 湖南理工学院,复杂系统优化与控制湖南省普通高等学校重点实验室,湖南 岳阳414006
  • 折叠

摘要

Abstract

A simple and digital control transistor tester is designed,the system uses a single chip ATmega328p as the control core,and the voltages that are sampled through its internal three-way ADC are process by the CPU and display by the LCD1602 dot graphic LCD. The system software adopts C language and uses the modular program-ming ideas,which has the function of stability,high accuracy and easy extensions and so on. The system has a key measurement function,and can automatically identify diodes,transistors,resistors,capacitors and inductors,then en-ters the parameter measurement mode automatically after identification. Finally,the system displays the parameters corresponding to the type of measurement components and the components of the pin through the LCD.

关键词

晶体管测试仪/数字控制/自动识别/模块化设计

Key words

transistor tester/digital control/automatic identification/modular design

分类

信息技术与安全科学

引用本文复制引用

荣军,何飞,张国云,丁跃浇..简易数字控制晶体管测试仪的设计∗[J].电子器件,2015,(2):377-381,5.

基金项目

湖南省高校科技创新团队支持计划项目(湘教通[2012]318号) (湘教通[2012]318号)

电子器件

OA北大核心CSTPCD

1005-9490

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