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Low Cost BIST Scheme Using LFSR-RC Reseeding

Bin Zhou Mingxue Huo Xinchun Wu

哈尔滨工业大学学报（英文版）Issue(3)：57-62,6.

哈尔滨工业大学学报（英文版）Issue(3)：57-62,6.DOI:10.11916/j.issn.1005-9113.2015.03.008

Low Cost BIST Scheme Using LFSR-RC Reseeding

Bin Zhou ¹Mingxue Huo ¹Xinchun Wu²

作者信息

1. Research Center of Basic Space Science, Harbin Institute of Technology, Harbin 150001, China
2. School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China
折叠

摘要

关键词

built-in self-test/linear feedback shift register ( LFSR)/ring counters( RCs)/test compression

Key words

built-in self-test/linear feedback shift register ( LFSR)/ring counters( RCs)/test compression

引用本文复制引用

Bin Zhou,Mingxue Huo,Xinchun Wu..Low Cost BIST Scheme Using LFSR-RC Reseeding[J].哈尔滨工业大学学报（英文版）,2015,(3):57-62,6.

基金项目

Sponsored by the National Natural Science Foundation of China（Grant No．61100031） and the Fundamental Research Funds for the Central Universities （Grant No．HIT．NSRIF．2015078）．（）

哈尔滨工业大学学报（英文版）

ISSN：1005-9113

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