航天器环境工程Issue(5)：510-515,6.DOI:10.3969/j.issn.1673-1379.2014.05.010
SRAM型FPGA空间应用的抗单粒子翻转设计
SEU-tolerant design for SRAM based FPGA on spacecraft
胡洪凯 1施蕾 1董暘暘 1刘波 1叶有时1
作者信息
摘要
Abstract
The SRAM-based FPGA is susceptible to single event upsets (SEU).Due to the effects and the errors induced by SEU, the function of the SRAM-based FPGA might be interrupted. The SEU-tolerant methods are designed for space applications, to improve the reliability of the SRAM-based FPGA on spacecraft. This paper reviews several SEU-tolerant methods, such as the triple modular redundancy(TMR) method, the scrubbing method and the FPGA dynamic partial reconfiguration technology.关键词
FPGA/单粒子翻转/容错设计/可靠性Key words
FPGA/single event upset/fault-tolerant design/reliability分类
信息技术与安全科学引用本文复制引用
胡洪凯,施蕾,董暘暘,刘波,叶有时..SRAM型FPGA空间应用的抗单粒子翻转设计[J].航天器环境工程,2014,(5):510-515,6.
