| 注册
首页|期刊导航|计量学报|基于正弦失真测量的A/D动态有效位数评价

基于正弦失真测量的A/D动态有效位数评价

梁志国

计量学报Issue(3):258-262,5.
计量学报Issue(3):258-262,5.DOI:10.3969/j.issn.1000-1158.2014.03.13

基于正弦失真测量的A/D动态有效位数评价

The EVaiuation Method of EffectiVe Bits of A/D ConVerters Based on Sinusoidai Distortion Measurement

梁志国1

作者信息

  • 1. 北京长城计量测试技术研究所计量与校准技术重点实验室,北京100095
  • 折叠

摘要

Abstract

Aiming at the measurement of effective bits of A/D converters,a method based on sinusoidal distortion measurement is presented,and the calculation formula is given out. One can realize the calibration of effective bits of A/D converters without complicated sinusoidal curve-fitting. When A/D bit varying from 3 bits to 24 bits,and sampling rate to frequency ratio is varied,by using a group of simulation,the measurement method is compared with the sine wave curve-fitting method. The results show that,the sinusoidal curve-fitting method fit for more cases,but the method is more simple and easy. Through a group of experiments,both the feasibility and correctness of the method in this paper are proved.

关键词

计量学/动态有效位数/A/D转换器/数据采集系统/数字示波器/正弦波

Key words

Metrology/Effective bits/A/D converter/Data acquisition systems/Digital oscilloscopes/Sinusoidal

引用本文复制引用

梁志国..基于正弦失真测量的A/D动态有效位数评价[J].计量学报,2014,(3):258-262,5.

计量学报

OA北大核心CSCDCSTPCD

1000-1158

访问量0
|
下载量0
段落导航相关论文