计算机与数字工程Issue(1)：39-43,5.DOI:10.3969/j.issn1672-9722.2015.01.012
基于 SOLT 校准技术的S参数测量不确定度评定磁
Evaluation of Measurement Uncertainty for S-parameters Based on SOLT Calibration Technology
韩志国 1梁法国 1栾鹏 1吴爱华 1李锁印1
作者信息
- 1. 中国电子科技集团公司第十三研究所 石家庄 050051
- 折叠
摘要
Abstract
Nowadays ,the relativity in the measurement uncertainty evaluation methods about S‐parameter isn't .A method for evaluating the uncertainty of S‐parameter is proposed .The method is based on the definition of calibration kits . Then the uncertainty of calibration kits propagates to the DUT from VNA self‐calibration .Eventually ,MCM is used to get the S‐parameters' measurement uncertainty of DUT .The relativity comsidered ,the method can get more credibility and rea‐sonable S‐parameters' measurement uncertainty of DUT .关键词
S 参数/校准件/MCM/测量不确定度Key words
S-parameter/calibration kit/MCM/measurement uncertainty分类
信息技术与安全科学引用本文复制引用
韩志国,梁法国,栾鹏,吴爱华,李锁印..基于 SOLT 校准技术的S参数测量不确定度评定磁[J].计算机与数字工程,2015,(1):39-43,5.
